DIAGNOSTIC MEASUREMENTS IN LSI &... (V7)
| By: | Jakubowski Andrzej; Marciniak Wieslaw; Przewlocki Henryk M |
| Publisher: | World Scientific Publishing |
| Print ISBN: | 9789810202828 |
| eText ISBN: | 9789814439268 |
| Edition: | 0 |
| Format: | Page Fidelity |
eBook Features
Instant Access
Purchase and read your book immediately
Read Offline
Access your eTextbook anytime and anywhere
Study Tools
Built-in study tools like highlights and more
Read Aloud
Listen and follow along as Bookshelf reads to you
This book describes means in improving the technology of LSI/VLSI ICs production. It does so by concentrating on improvements of manufacturing yield and quality of the products by detecting weak points which should be eliminated on the way up the learning curve. The book presents a systematic approach to the problem, covering primarily methods based on the use of test patterns measurements, in both mass production and in research and development activities. The main groups of defects found in IC chips and ways to detect them using test structures are discussed in detail.