FRONTIERS IN RELIABILITY (V4)
| By: | Basu Asit P; Basu Sujit K; Mukherjee Shyamaprasad |
| Publisher: | World Scientific Publishing |
| Print ISBN: | 9789810233600 |
| eText ISBN: | 9789812816580 |
| Edition: | 0 |
| Format: | Page Fidelity |
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This volume presents recent results in reliability theory by leading experts in the world. It will prove valuable for researchers, and users of reliability theory. It consists of refereed invited papers on a broad spectrum of topics in reliability. The subjects covered include Bayesian reliability, Bayesian reliability modeling, confounding in a series system, DF tests, Edgeworth approximation to reliability, estimation under random censoring, fault tree reduction for reliability, inference about changes in hazard rates, information theory and reliability, mixture experiment, mixture of Weibull distributions, queuing network approach in reliability theory, reliability estimation, reliability modeling, repairable systems, residual life function, software spare allocation systems, stochastic comparisons, stress-strength models, system-based component test plans, and TTT-transform.