Terrestrial Neutron-induced Soft Error In Advanced Memory Devices
| By: | Nakamura Takashi |
| Publisher: | World Scientific Publishing |
| Print ISBN: | 9789812778819 |
| eText ISBN: | 9789812778826 |
| Edition: | 0 |
| Format: | Page Fidelity |
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Table of Contents
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.