Migration Imaging of the Transient Electromagnetic Method
| By: | Xiu Li; Guoqiang Xue; Changchun Yin |
| Publisher: | Springer Nature |
| Print ISBN: | 9789811027079 |
| eText ISBN: | 9789811027086 |
| Edition: | 0 |
| Copyright: | 2017 |
| Format: | Page Fidelity |
eBook Features
Instant Access
Purchase and read your book immediately
Read Offline
Access your eTextbook anytime and anywhere
Study Tools
Built-in study tools like highlights and more
Read Aloud
Listen and follow along as Bookshelf reads to you
This book is based on more than a decade of research the authors have pursued on the pseudo-seismic migration imaging of the transient electromagnetic method, and provides a series of important findings on the theory and applications in this area. It present and analyzes transforming principles, TEM wave field methods, characteristics of the TEM virtual wave field and studies on many significant related technologies. The coverage is supplemented by a wealth of 1-D, 2-D and 3-D figures to illustrate pseudo-seismic theory. The book offers a valuable resource for teachers, students, researchers and engineers in the fields of geophysics, earth exploration and information technology.