Back to results
Cover image for book Kelvin Probe Force Microscopy

Kelvin Probe Force Microscopy

Measuring and Compensating Electrostatic Forces
By:null
Publisher:Springer Nature
Print ISBN:9783642225659
eText ISBN:9783642225666
Edition:0
Copyright:2012
Format:Page Fidelity

eBook Features

Instant Access

Purchase and read your book immediately

Read Offline

Access your eTextbook anytime and anywhere

Study Tools

Built-in study tools like highlights and more

Read Aloud

Listen and follow along as Bookshelf reads to you

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

• 2026 © SAU Tech Bookstore. All Rights Reserved.