Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis
| By: | Nobuo Tanaka |
| Publisher: | World Scientific Publishing |
| Print ISBN: | 9781848167896 |
| eText ISBN: | 9781783264711 |
| Edition: | 0 |
| Copyright: | 2015 |
| Format: | Reflowable |
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The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.