Analytical Techniques for Thin Films
Treatise on Materials Science and Technology, Vol. 27| By: | null |
| Publisher: | Elsevier S & T |
| Print ISBN: | 9780123418272 |
| eText ISBN: | 9781483218311 |
| Edition: | 0 |
| Copyright: | 1988 |
| Format: | Page Fidelity |
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Table of Contents
Treatise on Materials Science and Technology, Volume 27: Analytical Techniques for Thin Films covers a set of analytical techniques developed for thin films and interfaces, all based on scattering and excitation phenomena and theories. The book discusses photon beam and X-ray techniques; electron beam techniques; and ion beam techniques. Materials scientists, materials engineers, chemical engineers, and physicists will find the book invaluable.