X-Ray Line Profile Analysis in Materials Science
| By: | Jenő Gubicza |
| Publisher: | IGI Global |
| Print ISBN: | 9781466658523 |
| eText ISBN: | 9781466658530 |
| Edition: | 0 |
| Copyright: | 2014 |
| Format: | Page Fidelity |
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X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.