Applications and Metrology at Nanometer Scale 1
| By: | Pierre Richard Dahoo; Philippe Pougnet; Abdelkhalak El Hami |
| Publisher: | Wiley Global Research (STMS) |
| Print ISBN: | 9781786306401 |
| eText ISBN: | 9781119808145 |
| Edition: | 1 |
| Format: | Reflowable |
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