Characterization, Testing, Measurement, and Metrology

By:	J. Paulo Davim; Sunpreet Singh; Chander Prakash
Publisher:	Taylor & Francis
Print ISBN:	9780367554941
eText ISBN:	9781000193350
Edition:	1
Format:	Reflowable

Select an option

eBook Features

Instant Access

Purchase and read your book immediately

Access your eTextbook anytime and anywhere

Built-in study tools like highlights and more

Listen and follow along as Bookshelf reads to you

Details

Table of Contents